Interest of Laser Test Facility for the Assessment of Natural Radiation Environment Effects on Integrated Circuits Based Systems

Interest of Laser Test Facility for the Assessment of Natural Radiation Environment Effects on Integrated Circuits Based Systems

著者名:

Miller, Florent

掲載資料名:

Proceedings of the 7th European Conference on Radiation and its Effects on Components and Systems : RADECS 2003, 15-19 September 2003, Noordwijk, the Netherlands

シリーズ名:

ESA SP

シリーズ巻号:

536

発行年:

2004

開始ページ:

199

終了ページ:

210

総ページ数:

12

出版情報:

Noordwijk, the Netherlands: ESA Publication Division

ISSN:

03796566

ISBN:

9789290928461 [9290928468]

言語:

英語

請求記号:

E11690/536

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00051861
シリーズID:	PA00000009
会議名:	7th European Conference on Radiation and its Effects on Components and Systems (RADECS 2003)
回次:	7th
会議開催地:	Noordwijk, The Netherlands
会議開催年:	2003.09.15-2003.09.19

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