Systematic First Principles Calculations of the Effects of Stacking Faults Defects on the 4H-SiC Band Structure

Systematic First Principles Calculations of the Effects of Stacking Faults Defects on the 4H-SiC Band Structure

著者名:

M. Camarda

掲載資料名:

Silicon Carbide 2010--materials, processing and devices : symposium held April 5-9, 2010, San Francisco, California

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

1246

発行年:

2010

開始ページ:

65

終了ページ:

70

総ページ数:

6

出版情報:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781605112237 [1605112232]

言語:

英語

請求記号:

M23500/1246

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00050335
シリーズID:	PA00000011
会議名:	MRS Spring Meeting : Symposium B
回次:	2010
会議開催地:	San Francisco, California, USA
会議開催年:	2010.04.05-2010.04.09

類似資料:

1 国際会議録 Systematic First Principles Calculations of the Effects of Stacking Fault Defects on the 4H-SiC Band Structure M. Camarda, P. Delugas, A. Canino, A. Severino, N. Piluso Trans Tech Publications	7 国際会議録 Extended Characterization of the Stress Fields in the Heteroepitaxial Growth of 3C-SiC on Silicon for Sensors and Device Applications M. Camarda, R. Anzalone, N. Piluso, A. Severino, A. Canino Trans Tech Publications
2 国際会議録 Raman Study of Bulk Mobility in 3C-SiC Heteroepitaxy N. Piluso, A. Severino, M. Camarda, A. Canino, A. La Magna Trans Tech Publications	8 国際会議録 Raman Characterization of Doped 3C-SiC/Si for Different Silicon Substrates and C/Si Ratios N. Piluso, A. Severino, M. Camarda, R. Anzalone, A. Canino Trans Tech Publications
3 国際会議録 Evolution of Stacking Faults Defects During Epitaxial Growths: Role of Surface Kinetics M. Camarda, A. La Magna, A. Canino, F. La Via Materials Research Society	9 国際会議録 Fast Growth Rate Epitaxy by Chloride Precursors F. La Via, M. Camarda, A. Canino, A. Severino, A. La Magna Trans Tech Publications
4 国際会議録 Raman Stress Characterization of Hetero-Epitaxial 3C-SiC Free Standing Structures N. Piluso, M. Camarda, R. Anzalone, A. Severino, A. La Magna Trans Tech Publications	10 国際会議録 Curvature Evaluation of Si/3C-SiC/Si Hetero-Structure Grown by Chemical Vapor Deposition R. Anzalone, M. Camarda, A. Severino, N. Piluso, F. La Via Trans Tech Publications
5 国際会議録 Micro-Raman Characterization of 4H-SiC Stacking Faults N. Piluso, M. Camarda, R. Anzalone, F. La Via Trans Tech Publications	11 国際会議録 Complete Determination of the Local Stress Field in Epitaxial Thin Films Using Single Microstructure M. Camarda, R. Anzalone, A. Severino, N. Piluso, A. La Magna Trans Tech Publications
6 国際会議録 Stress Relaxation Study in 3C-SiC Microstructures by Micro-Raman Analysis and Finite Element Modeling N. Piluso, R. Anzalone, A. Severino, A. Canino, A. La Magna Trans Tech Publications	12 国際会議録 Structural Characterization of Heteroepitaxial 3C-SiC A. Severino, R. Anzalone, M. Camarda, N. Piluso, F. La Via Trans Tech Publications

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