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Minority Carrier Lifetime Measurement Based on Low Frequency Fluctuation

著者名:
掲載資料名:
Reliability and materials issues of semiconductor optical and electrical devices and materials : symposium held November 29 - December 3, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
1195
発行年:
2010
開始ページ:
259
終了ページ:
272
総ページ数:
14
出版情報:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781605111681 [1605111686]
言語:
英語
請求記号:
M23500/1195
資料種別:
国際会議録

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