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Defects in Hydrogenated Amorphous Silicon Carbide Alloys using Electron Spin Resonance and Photothermal Deflection Spectroscopy

著者名:
Brian J. Simonds
Feng Zhu
Josh Gallon
Jian Hu
Arun Madan
Craig Taylor
さらに 1 件
掲載資料名:
Amorphous and polycrystalline thin-film silicon science and technology--2009 : symposium held April 14-17, 2009, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
1153
発行年:
2009
開始ページ:
371
終了ページ:
378
総ページ数:
8
出版情報:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781605111261 [1605111260]
言語:
英語
請求記号:
M23500/1153
資料種別:
国際会議録

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