Imaging electron transport across grain boundaries in an integrated electron and atomic force microscopy platform: Application to polycrystalline silicon solar cells
- 著者名:
M. J. Romero F. Liu O. Kunz J. Wong C.-S. Jiang M. M. Al-Jassim A. G. Aberle - 掲載資料名:
- Amorphous and polycrystalline thin-film silicon science and technology--2009 : symposium held April 14-17, 2009, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 1153
- 発行年:
- 2009
- 開始ページ:
- 287
- 終了ページ:
- 294
- 総ページ数:
- 8
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781605111261 [1605111260]
- 言語:
- 英語
- 請求記号:
- M23500/1153
- 資料種別:
- 国際会議録
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