Blank Cover Image

Simultaneous Reflection and Transmission Measurements to Determine the Optical Constants of Thin Films in the Extreme Ultraviolet

著者名:
掲載資料名:
49th annual technical conference proceedings, April 22-27, 2006, Washington, D.C.
シリーズ名:
Annual Technical Conference of Society of Vacuum Coaters
シリーズ巻号:
49
発行年:
2006
開始ページ:
314
終了ページ:
318
総ページ数:
5
出版情報:
Albuquerque, NM: Society of Vacuum Coaters
ISSN:
07375921
言語:
英語
請求記号:
A63930/49
資料種別:
国際会議録

類似資料:

Brimhall, F. N., Grigg, B. A., Turley, S. R., Allred, D. D.

SPIE - The International Society of Optical Engineering

Mrafko,P., Ozvold,M.

SPIE-The International Society for Optical Engineering

Sandberg, R.L., Allred, D.D., Lunt, S., Urry, M.K., Turley, R.S.

SPIE - The International Society of Optical Engineering

Squires,M.B., Allred,D.D., Turley,R.S.

SPIE - The International Society for Optical Engineering

G. Acosta, R. Vanfleet, D. Allred, R.S. Turley

Society of Vacuum Coaters

G. Acosta, D.D. Allred, R.C. Davis

Society of Vacuum Coaters

Brimhall, N., Painter, C. J., Turner, M., Voronov, V. S., Turley, S. R., Ware, M., Peatross, J.

SPIE - The International Society of Optical Engineering

Yao, X., Tong, N., Xiong, C.

SPIE - The International Society of Optical Engineering

Bissell, L.J., Allred, D.D., Turley, R.S., Evans, W.R., Johnson, J.E.

SPIE - The International Society of Optical Engineering

A.R. Forouhi, I. Bloomer

Society of Photo-optical Instrumentation Engineers

Aznarez, J.A., Larruquert, J.I., Mendez, J.A., Covini, S., Malvezzi, A.M., Poletto, L.

SPIE - The International Society of Optical Engineering

Acosta, D. R., Zironi, E., Estrada, W., Montoya, E.

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12