Simultaneous Reflection and Transmission Measurements to Determine the Optical Constants of Thin Films in the Extreme Ultraviolet
- 著者名:
- D.D. AlIred ( Brigham Young University, Provo, UT )
- G.A. Acosta ( Brigham Young University, Provo, UT )
- N. Farnsworth-Brimhall ( Brigham Young University, Provo, UT )
- R. S. Turley ( Brigham Young University, Provo, UT )
- 掲載資料名:
- 49th annual technical conference proceedings, April 22-27, 2006, Washington, D.C.
- シリーズ名:
- Annual Technical Conference of Society of Vacuum Coaters
- シリーズ巻号:
- 49
- 発行年:
- 2006
- 開始ページ:
- 314
- 終了ページ:
- 318
- 総ページ数:
- 5
- 出版情報:
- Albuquerque, NM: Society of Vacuum Coaters
- ISSN:
- 07375921
- 言語:
- 英語
- 請求記号:
- A63930/49
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
7
国際会議録
Determining optical constants of thin film on substrate from transmission and reflection data
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Construction of an extreme ultraviolet polarimeter based on high-order harmonic generation [6317-34]
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