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Recent Advances in Optical Characterization of Thin Films by Spectroscopic Ellipsometry

著者名:
D.E. Aspnes ( Physics Dept., North Carolina State University, Raleigh, NC )  
掲載資料名:
48th annual technical conference proceedings, April 23-28, 2005, Denver, Colorado
シリーズ名:
Annual Technical Conference of Society of Vacuum Coaters
シリーズ巻号:
48
発行年:
2005
開始ページ:
337
終了ページ:
340
総ページ数:
4
出版情報:
Albuquerque, NM: Society of Vacuum Coaters
ISSN:
07375921
言語:
英語
請求記号:
A63930/48
資料種別:
国際会議録

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