Characterization of Intermittent Contact in Tapping Mode Atomic Force Microscopy
- 著者名:
- 掲載資料名:
- 5th International Conference on Multibody Systems, Nonlinear Dynamics, and Control, Parts A, B, and C; Volume 6
- シリーズ名:
- ASME Symposia Volumes
- シリーズ巻号:
- DETC 2005(6C)
- 発行年:
- 2005
- 巻:
- 6C
- ペーパー番号:
- DETC2005-84741
- 開始ページ:
- 2011
- 終了ページ:
- 2020
- 総ページ数:
- 10
- 出版情報:
- New York, N.Y.: American Society of Mechanical Engineers
- ISBN:
- 9780791847435 [0791847438]
- 言語:
- 英語
- 請求記号:
- A11633/2005
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
Materials Research Society |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
Materials Research Society | |
Trans Tech Publications |
American Society of Mechanical Engineers |
5
国際会議録
Tapping and shear-mode atomic force microscopy using a quartz tuning fork with high quality factor
Society of Photo-optical Instrumentation Engineers |
American Society of Mechanical Engineers |
Trans Tech Publications |
American Society of Mechanical Engineers |