Characterization of Intermittent Contact in Tapping Mode Atomic Force Microscopy

Characterization of Intermittent Contact in Tapping Mode Atomic Force Microscopy

著者名:

掲載資料名:

5th International Conference on Multibody Systems, Nonlinear Dynamics, and Control, Parts A, B, and C; Volume 6

シリーズ名:

ASME Symposia Volumes

シリーズ巻号:

DETC 2005(6C)

発行年:

2005

巻:

6C

ペーパー番号:

DETC2005-84741

開始ページ:

2011

終了ページ:

2020

総ページ数:

10

出版情報:

New York, N.Y.: American Society of Mechanical Engineers

ISBN:

9780791847435 [0791847438]

言語:

英語

請求記号:

A11633/2005

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00048602
シリーズID:	PA00000270
会議名:	ASME International Design Engineering Technical Conference ; Computers and Information in Engineering Conference ; International Conference on Multibody Systems, Nonlinear Dynamics, and Control
回次:	2005 ; 2005 ; 5th
会議開催地:	Long Beach, California USA
会議開催年:	2005.09.24-2005.09.28

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