Probabilistic Analysis of Notched Micro Specimen Under Three-Point Loading

Probabilistic Analysis of Notched Micro Specimen Under Three-Point Loading

著者名:

掲載資料名:

ASME 2005 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference (IDETC/CIE2005)

シリーズ名:

ASME Symposia Volumes

シリーズ巻号:

DETC 2005(4)

発行年:

2005

巻:

4

ペーパー番号:

DETC2005-85493

開始ページ:

717

終了ページ:

726

総ページ数:

10

出版情報:

New York, N.Y.: American Society of Mechanical Engineers

ISBN:

9780791847411 [0791847411]

言語:

英語

請求記号:

A11633/2005

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00048598
シリーズID:	PA00000270
会議名:	ASME International Design Engineering Technical Conference ; Computers and Information in Engineering Conference ; ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications ; Design for Manufacturing and the Life Cycle Conference ; Reliability, Stress Analysis and Failure Prevention Conference
回次:	2005 ; 2005 ; 2005 ; 2005 ; 18th
会議開催地:	Long Beach, California USA
会議開催年:	2005.09.24-2005.09.28

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