Regular Dislocation Networks in Silicon as a Tool for Novel Device Application

Regular Dislocation Networks in Silicon as a Tool for Novel Device Application

著者名:

M. Kittler

掲載資料名:

High purity silicon 9

シリーズ名:

ECS transactions

シリーズ巻号:

3(4)

発行年:

2006

開始ページ:

429

終了ページ:

450

総ページ数:

22

出版情報:

Pennington, N.J.: Electrochemical Society

ISSN:

19385862

ISBN:

9781566775045 [1566775043]

言語:

英語

請求記号:

E23400/3-4

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00047112
シリーズID:	PA00000034
会議名:	International Symposium on High Purity Silicon ; Meeting of the Electrochemical Society
回次:	2006 ; 210th
会議開催地:	Cancun, Mexico
会議開催年:	2006.10.29-2006.11.03

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1 国際会議録 Dislocation-Induced Light Emission M. Reiche, M. Kittler, T. Wilhelm, T. Arguirov, W. Seifert Electrochemical Society	7 国際会議録 Dislocation Networks Formed by Silicon Wafer Direct Bonding M. Reiche Trans Tech Publications
2 国際会議録 Stark effect at dislocations in silicon for modulation of a 1.5-µm light emitter M. Kittler, M. Reiche, T. Mchedlidze, T. Arguirov, G. Jia Society of Photo-optical Instrumentation Engineers	8 国際会議録 Dislocations in Silicon and D-Band Luminescence for Infrared Light Emitters V.V. Kveder, M. Kittler Trans Tech Publications
3 国際会議録 Silicon-based light emission after ion implantation Kittler, M., Arguirov, T., Seifert, W. SPIE - The International Society of Optical Engineering	9 国際会議録 ELECTRICAL AND RECOMBINATIVE PROPERTIES OF PRECIPTATED AND INTERSTITIAL COPPER IN SILICON Istratov, A.A., Hedemann, H., Seibt, M., Vyvenko, O.F., Schroeter, W., Flink, C., Heiser, T., Hieslmair, H., Weber, E.R. Electrochemical Society
4 国際会議録 INFLUENCE OF RAPID THERMAL ANNEALING ON RECOMBINATION PROPERTIES OF POLYCRYSTALLINE SILICON Kittler, M., Seifert, W. Materials Research Society	10 国際会議録 Integration of SiGe to MEMS applications M. Reiche Electrochemical Society
5 国際会議録 Analysis of the Recombination-Active Region Around Extended Defects in Silicon Kittler,M., Seifert,W. Trans Tech Publications	11 国際会議録 On the Influence of Transition Metal Impurities on the Oxygen Precipitation in CZ-Grown Silicon Reiche,M. Trans Tech Publications
6 国際会議録 Modification of Recombination Activity of Dislocations in Si and SiGe by Contamination and Hydrogenation Kittler, M., Seifert, W., Higgs, V. MRS - Materials Research Society	12 国際会議録 Subsurface Damage in Single Diamond Tool Machined Si Wafers Mchedlidze,T.R., Yonenaga,I., Sumino,K. Trans Tech Publications

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