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Spatially Resolved Characterization of Plastic Deformation Induced by Focused-Ion Beam Processing in Structured InGaN/GaN Layers

著者名:
R. Barabash
G. Ice
R. Kroger
H. Lohmeyer
K. Sebald
J. Gutowski
I. Bottcher
D. Hommel
W. Liu
J.-S. Chung
さらに 5 件
掲載資料名:
Ion-beam-based nanofabrication : symposium held April 10-12, 2007, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
1020
発行年:
2007
開始ページ:
21
終了ページ:
28
総ページ数:
8
出版情報:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558999800 [1558999809]
言語:
英語
請求記号:
M23500/1020
資料種別:
国際会議録

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