Influences of linear birefringence on bulk glass current sensors with return-back optical paths

Influences of linear birefringence on bulk glass current sensors with return-back optical paths

著者名:

Z. Wang ( Harbin Engineering Univ. (China) )
X. Liu ( Harbin Engineering Univ. (China) )
Z. Huang ( Harbin Engineering Univ. (China) )

掲載資料名:

Optical Measurement Systems for Industrial Inspection V

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6616

発行年:

2007

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819467584 [0819467588]

言語:

英語

請求記号:

P63600/6616

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00046923
シリーズID:	PA00000029
会議名:	Optical Metrology : Optical Measurement Systems for Industrial Inspection
回次:	2007 : 5th
会議開催地:	Munich, Germany
会議開催年:	2007.06.18-2007.06.22

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