Generation-recombination noise in forward-biased 4H-SiC p-n diode
- 著者名:
S. L. Rumyantsev ( Rensselaer Polytechnic Institute (USA) and Ioffe Institute (Russia) ) A. Dmitriev ( Ioffe Institute (Russia) ) M. Levinshtein ( Ioffe Institute (Russia) ) D. Veksler ( Rensselaer Polytechnic Institute (USA) ) M. S. Shur ( Rensselaer Polytechnic Institute (USA) ) J. Palmour ( Cree, Inc. (USA) ) M. Das ( Cree, Inc. (USA) ) B. Hull ( Cree, Inc. (USA) ) - 掲載資料名:
- Noise and fluctuations in circuits, devices, and materials : 21-24 May 2007, Florence, Italy
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6600
- 発行年:
- 2007
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819467379 [0819467375]
- 言語:
- 英語
- 請求記号:
- P63600/6600
- 資料種別:
- 国際会議録
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10
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