1/f noise in SiGe HBTs fabricated on CMOS-compatible thin-film SOI
- 著者名:
- M. Bellini ( Georgia Tech (USA) )
- P. Cheng ( Georgia Tech (USA) )
- A. Appaswamy ( Georgia Tech (USA) )
- J. D. Cressler ( Georgia Tech (USA) )
- J. Cai ( IBM Thomas Watson Research Ctr. (USA) )
- 掲載資料名:
- Noise and fluctuations in circuits, devices, and materials : 21-24 May 2007, Florence, Italy
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6600
- 発行年:
- 2007
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819467379 [0819467375]
- 言語:
- 英語
- 請求記号:
- P63600/6600
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
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SPIE - The International Society of Optical Engineering |
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11
国際会議録
Temperature Dependence of Early Voltage and Current Gain-Early Voltage Product in SiGe HBTs
Electrochemical Society |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |