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On the mechanisms of low-frequency noise in vertical silicon pnp BJTs

著者名:
  • P. Cheng ( Georgia Institute of Technology (USA) )
  • E. Zhao ( Georgia Institute of Technology (USA) )
  • J. D. Cressler ( Georgia Institute of Technology (USA) )
  • J. Prasad ( Maxim Semiconductor (USA) )
掲載資料名:
Noise and fluctuations in circuits, devices, and materials : 21-24 May 2007, Florence, Italy
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6600
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819467379 [0819467375]
言語:
英語
請求記号:
P63600/6600
資料種別:
国際会議録

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