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Advanced remote-sensing imaging emission spectrometer (ARIES): system-level design tradeoffs

著者名:
掲載資料名:
Algorithms and technologies for multispectral, hyperspectral, and ultraspectral imagery XIII : 9-12 April 2007, Orlando, Florida, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6565
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819466877 [0819466875]
言語:
英語
請求記号:
P63600/6565
資料種別:
国際会議録

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