Multicamera phase measuring profilometry for accurate depth measurement

Multicamera phase measuring profilometry for accurate depth measurement

著者名:

Y. Wang ( Univ. of Kentucky (USA) )
K. Liu ( Univ. of Kentucky (USA) )
Q. Hao ( Univ. of Kentucky (USA) )
D. Lau ( Univ. of Kentucky (USA) )
L. G. Hassebrook ( Univ. of Kentucky (USA) )

掲載資料名:

Sensors and systems for space applications : 9-11 April 2007, Orlando, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6555

発行年:

2007

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819466778 [0819466778]

言語:

英語

請求記号:

P63600/6555

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00046862
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Sensors and Systems for Space Applications
回次:	2007
会議開催地:	Orlando, Florida, USA
会議開催年:	2007.04.09-2007.04.11

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