Muon imaging and data modeling
- 著者名:
H. M. Jaenisch ( dtech Systems Inc. (USA) ) J. W. Handley ( dtech Systems Inc. (USA) ) M. L. Hicklen ( dtech Systems Inc. (USA) ) D. C. Vineyard ( Decision Sciences Corp. (USA) ) M. D. Ramage ( Decision Sciences Corp. (USA) ) J. M. Colthart ( Decision Sciences Corp. (USA) ) - 掲載資料名:
- Sensors, and command, control, communications, and intelligence (C3I) technologies for homeland security and homeland defense VI : 9-12 April 2007, Orlando, Florida, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6538
- 発行年:
- 2007
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819466600 [0819466603]
- 言語:
- 英語
- 請求記号:
- P63600/6538
- 資料種別:
- 国際会議録
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