Nondestructive evaluation and quality control of surface treatments

Nondestructive evaluation and quality control of surface treatments

著者名:

C. A. Rideout ( Positron Systems, Inc. (USA) )
S. J. Ritchie ( Positron Systems, Inc. (USA) )

掲載資料名:

Sensor systems and networks : phenomena, technology, and applications for NDE and health monitoring 2007 : 19-21 March 2007, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6530

発行年:

2007

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819466518 [0819466514]

言語:

英語

請求記号:

P63600/6530

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00046837
シリーズID:	PA00000029
会議名:	Smart Structures : Sensor systems and networks
回次:	2007
会議開催地:	San Diego, CA, USA
会議開催年:	2007.03.19-2007.03.21

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