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A systematic approach for capturing interconnects hot spots

著者名:
M. Al-Imam ( Mentor Graphics Corp. (USA) )
H. Y. Liao ( Mentor Graphics Corp. (USA) )
J. Schacht ( Mentor Graphics Corp. (USA) )
T. H. Wu ( United Microelectronics Corp. (Taiwan) )
C. W. Huang ( United Microelectronics Corp. (Taiwan) )
S. Y. Huang ( United Microelectronics Corp. (Taiwan) )
P. R. Tsai ( United Microelectronics Corp. (Taiwan) )
C. H. Yang ( United Microelectronics Corp. (Taiwan) )
さらに 3 件
掲載資料名:
Design for manufacturability through design-process integration : 28 February-2 March 2007, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6521
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819466402 [0819466409]
言語:
英語
請求記号:
P63600/6521
資料種別:
国際会議録

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