OCD metrology by floating n/k
- 著者名:
S. Yu ( Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) ) J. Huang ( Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) ) C. Ke ( Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) ) T. Gau ( Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) ) B. J. Lin ( Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) ) A. Yen ( Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) ) L. Lane ( Timbre Technologies, Inc. (USA) ) V. Vuong ( Timbre Technologies, Inc. (USA) ) Y. Chen ( Timbre Technologies, Inc. (USA) ) - 掲載資料名:
- Metrology, inspection, and process control for microlithography XXI
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6518
- 発行年:
- 2007
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819466372 [0819466379]
- 言語:
- 英語
- 請求記号:
- P63600/6518
- 資料種別:
- 国際会議録
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