Blank Cover Image

Effect of slow display on stack-mode reading of volumetric image datasets using an anthropomorphic observer

著者名:
  • H. Liang ( NIBIB/CDRH Lab. for the Assessment of Medical Imaging Systems, FDA (USA) )
  • S. Park ( NIBIB/CDRH Lab. for the Assessment of Medical Imaging Systems, FDA (USA) )
  • B. D. Gallas ( NIBIB/CDRH Lab. for the Assessment of Medical Imaging Systems, FDA (USA) )
  • A. Badano ( NIBIB/CDRH Lab. for the Assessment of Medical Imaging Systems, FDA (USA) )
掲載資料名:
Medical imaging 2007, Image perception, observer performance, and technology assessment : 21-22 February 2007, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6515
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819466334 [0819466336]
言語:
英語
請求記号:
P63600/6515
資料種別:
国際会議録

類似資料:

Badano, A., Gallas, B. D., Fifadara, D. H.

SPIE - The International Society of Optical Engineering

Lee, J. D., Jang, H. W., Nam, H., Song, M. S., Kim, B. S., Oh, Y. S.

SPIE-The International Society for Optical Engineering

S. Park, A. Badano, B. D. Gallas, K. J. Myers

SPIE - The International Society of Optical Engineering

I. S. Kyprianou, A. Badano, B. D. Gallas, K. J. Myers

SPIE - The International Society of Optical Engineering

H. Liang, A. Badano

Society of Photo-optical Instrumentation Engineers

Liang, H., Badano, A.

SPIE - The International Society of Optical Engineering

Park, S., Gallas, B., Badano, A., Petrick, N., Myers, K.

SPIE - The International Society of Optical Engineering

Gallas, B.D.

SPIE-The International Society for Optical Engineering

A. Saha, H. Liang, A. Badano

SPIE - The International Society of Optical Engineering

Wang X. H, Maitz G. S, Leader J. K, Good W.F

SPIE - The International Society of Optical Engineering

Kyprianou, I. S., Badano, A., Gallas, B. D., Park, S., Myers, K. J.

SPIE - The International Society of Optical Engineering

J.-B. Hyun, D.-C. Hwang, J.-S. Park, D.-H. Shin, E.-S. Kim

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12