Blank Cover Image

Network patterns recognition for automatic dermatologic images classification

著者名:
掲載資料名:
Medical imaging 2007, Image processing : 18-20 February 2007, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6512
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819466303 [0819466301]
言語:
英語
請求記号:
P63600/6512
資料種別:
国際会議録

類似資料:

Grana, C., Pellacani, G., Seidenari, S., Cucchiara, R.

SPIE - The International Society of Optical Engineering

Abrukov, V. S., Smirnov, E. V., Ivanov, D. G.

SPIE - The International Society of Optical Engineering

Melli, R., Grana, C., Cucchiara, R.

SPIE - The International Society of Optical Engineering

N. Ma, J. Ghan, S. Mishra, C. Spanos, K. Poolla

Society of Photo-optical Instrumentation Engineers

Cozien,R.F., Rosenberger,C., Eyherabide,P., Rossettini,J., Ceyrolle,A.

SPIE - The International Society for Optical Engineering

Vargas,A., Martin,C.San, Figueroa,R., Campos,J., Yzuel,M.J.

SPIE-The International Society for Optical Engineering

Behnke, K.J., Rettmann, M.E., Pham, D.L., Shen, D., Resnick, S.M., Davatzikos, C., Prince, J.L.

SPIE-The International Society for Optical Engineering

S.K. Rogers, J.M. Colombi, C.E. Martin, J.C. Gainey, Jr., K.H. Fielding

Society of Photo-optical Instrumentation Engineers

Tellechea,M., Grana,M.

SPIE-The International Society for Optical Engineering

Arguelles C., A. J., Diaz de Leon S.,, J. L., Ya-ez Marquez, C., Camacho N., O.Instituto Politecnico Nacional (Mexico)

SPIE - The International Society of Optical Engineering

Mitsuyama,S., Motoike,J., Matsuo,H.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12