Blank Cover Image

Edge-directed inference for microaneurysms detection in digital fundus images

著者名:
  • K. Huang ( Michigan State Univ. (USA) )
  • M. Yan ( Siemens Corporate Research (USA) )
  • S. Aviyente ( Michigan State Univ. (USA) )
掲載資料名:
Medical imaging 2007, Image processing : 18-20 February 2007, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6512
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819466303 [0819466301]
言語:
英語
請求記号:
P63600/6512
資料種別:
国際会議録

類似資料:

Aviyente, S.

SPIE-The International Society for Optical Engineering

M. J. Cree, H. F. Jelinek

Society of Photo-optical Instrumentation Engineers

Huang, K., Aviyente, S.

SPIE - The International Society of Optical Engineering

Wu,S., Yan,H., Tan,Z.

SPIE-The International Society for Optical Engineering

Aviyente, S.

SPIE - The International Society of Optical Engineering

Lou,S.L., Sickles,E.A., Huang,H.K., Cao,F., Hoogstrate,D.R., Jahangiri,M.I.

SPIE-The International Society for Optical Engineering

Huang, K., Yan, M.

SPIE - The International Society of Optical Engineering

Jee,K.-W., Antonuk,L.E., El-Mohri,Y., Maolinbay,M., Zhao,Q.

SPIE-The International Society for Optical Engineering

Beach,J.M., Tiedeman,J.S., Hopkins,M.F., Sabharwal,Y.S.

SPIE - The International Society for Optical Engineering

T. Nagaoka, A. Nakamura, K. Aizawa, M. Kanazawa, T. Kezuka, M. Miura, M. Usui, S. Ohtsubo, T. Sota

SPIE - The International Society of Optical Engineering

Yang, Chun Lan, Yuan, Ye, Liu, Bing, Xue, Yan Qing, Wu, Shui Cai

Trans Tech Publications

Yamamoto,H., Homma,K., Isobe,T., Naka,M., Matsumura,S., Tameishi,H.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12