A temperature-resistant wide-dynamic-range CMOS image sensor
- 著者名:
K. Mizobuchi ( Texas Instruments Japan (Japan) ) S. Adachi ( Texas Instruments Japan (Japan) ) T. Yamashita ( Texas Instruments Japan (Japan) ) S. Okamura ( Texas Instruments Japan (Japan) ) H. Oshikubo ( Texas Instruments Japan (Japan) ) N. Akahane ( Tohoku Univ. (Japan) ) S. Sugawa ( Tohoku Univ. (Japan) ) - 掲載資料名:
- Sensors, cameras, and systems for scientific/industrial applications VIII : 30 January-1 February 2007, San Jose, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6501
- 発行年:
- 2007
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819466143 [081946614X]
- 言語:
- 英語
- 請求記号:
- P63600/6501
- 資料種別:
- 国際会議録
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6
国際会議録
A 960-fps sub-sampling object extraction CMOS image sensor with 12-bit column parallel ADCs and ALUs
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |