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Cryo-electron microscopy single particle reconstruction of virus particles using compressed sensing theory

著者名:
M. W. Kim ( Korea Advanced Institute of Science and Technology (South Korea) )
J. Choi ( Korea Advanced Institute of Science and Technology (South Korea) )
L. Yu ( Korea Advanced Institute of Science and Technology (South Korea) )
K. E. Lee ( Korea Univ. (South Korea) )
S. Han ( Korea Univ. (South Korea) )
J. C. Ye ( Korea Advanced Institute of Science and Technology (South Korea) )
さらに 1 件
掲載資料名:
Computational imaging V : 29-31 January 2007, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6498
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819466112 [0819466115]
言語:
英語
請求記号:
P63600/6498
資料種別:
国際会議録

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