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Study on metal/p-GaN contacts on p-i-n GaN-based UV detectors

著者名:
  • X. Li ( Shanghai Institute of Technical Physics (China) )
  • J. Chen ( Shanghai Institute of Technical Physics (China) )
  • J. Xu ( Shanghai Institute of Technical Physics (China) )
  • H. Gong ( Shanghai Institute of Technical Physics (China) )
  • J. Fang ( Shanghai Institute of Technical Physics (China) )
掲載資料名:
Ultrafast phenomena in semiconductors and nanostructure materials XI and semiconductor photodetectors IV : 22-24 January 2007, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6471
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819465849 [0819465844]
言語:
英語
請求記号:
P63600/6471
資料種別:
国際会議録

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