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Simple chromatic dispersion measurement method using a spectral interferometer

著者名:
  • J. Y. Lee ( Gwangju Institute of Science and Technology (South Korea) )
  • I. H. Shin ( Gwangju Institute of Science and Technology (South Korea) )
  • S. R. Lee ( Gwangju Institute of Science and Technology (South Korea) )
  • T. Wei ( Gwangju Institute of Science and Technology (South Korea) )
  • D. Y. Kim ( Gwangju Institute of Science and Technology (South Korea) )
掲載資料名:
Optical components and materials IV : 22-24 January 2007, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6469
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819465825 [0819465828]
言語:
英語
請求記号:
P63600/6469
資料種別:
国際会議録

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