Reflectance and fluorescence imaging with a MEMS dual-axes confocal microscope

Reflectance and fluorescence imaging with a MEMS dual-axes confocal microscope

著者名:

H. Ra ( Stanford Univ. (USA) )
W. Piyawattanametha ( Stanford Univ. and National Electronics and Computer Technology Ctr. (Thailand) )
Y. Taguchi ( Stanford Univ. (USA) )
O. Solgaard ( Stanford Univ. (USA) )

掲載資料名:

MOEMS and miniaturized systems VI : 24-25 January 2007, San Jose, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6466

発行年:

2007

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819465795 [0819465798]

言語:

英語

請求記号:

P63600/6466

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00046774
シリーズID:	PA00000029
会議名:	Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components : MOEMS and Miniaturized Systems
回次:	2007 : 6th
会議開催地:	San Jose, CA, USA
会議開催年:	2007.01.24-2007.01.25

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