Extending the wavelength range of single-emitter diode lasers for medical and sensing applications: 12xx-nm quantum dots, 2000-nm wells, > 5000-nm cascade lasers

Extending the wavelength range of single-emitter diode lasers for medical and sensing applications: 12xx-nm quantum dots, 2000-nm wells, > 5000-nm cascade lasers

著者名:

P. Crump ( nLight Corp. (USA) )

S. Patterson ( nLight Corp. (USA) )

S. Elim ( nLight Corp. (USA) )

S. Zhang ( nLight Corp. (USA) )

M. Bougher ( nLight Corp. (USA) )

J. Patterson ( nLight Corp. (USA) )

S. Das ( nLight Corp. (USA) )

W. Dong ( nLight Corp. (USA) )

M. Grimshaw ( nLight Corp. (USA) )

J. Wang ( nLight Corp. (USA) )

D. Wise ( nLight Corp. (USA) )

M. DeFranza ( nLight Corp. (USA) )

J. Bell ( nLight Corp. (USA) )

J. Farmer ( nLight Corp. (USA) )

M. DeVito ( nLight Corp. (USA) )

R. Martinsen ( nLight Corp. (USA) )

A. Kovsh ( NL Nanosemiconductor GmbH (Germany) )

F. Toor ( Princeton Univ. (USA) )

C. F. Gmachl ( Princeton Univ. (USA) )

さらに 14 件

掲載資料名:

High-power diode laser technology and applications V : 22-24 January 2007, San Jose, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6456

発行年:

2007

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819465696 [0819465690]

言語:

英語

請求記号:

P63600/6456

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00046764
シリーズID:	PA00000029
会議名:	SPIE LASE : High-Power Diode Laser Technology and Applications
回次:	2007 : 5th
会議開催地:	San Jose, California, USA
会議開催年:	2007.01.22-2007.01.24

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2 国際会議録 Diode laser bars deliver > 400-W peak CW power from 800-nm to 980-nm enabling wide range of applications [6397-06] Crump, P., Patterson, S., Wang, J., Dong, W., Grimshaw, M., Zhang, S., Elim, S., Bougher, M., Patterson, J., Das, S., … SPIE - The International Society of Optical Engineering	8 国際会議録 A CTE matched hard solder passively cooled laser diode package combined with nXLT facet passivation enables high power, high reliability operation A. Hodges, J. Wang, M. DeFranza, X. Liu, B. Vivian, C. Johnson, P. Crump, P. Leisher, M. DeVito, R. Martinsen, J. Bell SPIE - The International Society of Optical Engineering
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