Reliability and failure mode investigation of high-power multimode InGaAs strained quantum well single emitters

Reliability and failure mode investigation of high-power multimode InGaAs strained quantum well single emitters

著者名:

Y. Sin ( The Aerospace Corp. (USA) )
B. Foran ( The Aerospace Corp. (USA) )
N. Presser ( The Aerospace Corp. (USA) )
M. Mason ( The Aerospace Corp. (USA) )
S. C. Moss ( The Aerospace Corp. (USA) )

掲載資料名:

High-power diode laser technology and applications V : 22-24 January 2007, San Jose, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6456

発行年:

2007

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819465696 [0819465690]

言語:

英語

請求記号:

P63600/6456

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00046764
シリーズID:	PA00000029
会議名:	SPIE LASE : High-Power Diode Laser Technology and Applications
回次:	2007 : 5th
会議開催地:	San Jose, California, USA
会議開催年:	2007.01.22-2007.01.24

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