Trust region method for DOT image reconstruction
- 著者名:
- K. Kwon ( Yonsei Univ. (South Korea) )
- D. -S. Ho ( Yonsei Univ. (South Korea) )
- G. -Y. Eom ( Yonsei Univ. (South Korea) )
- S. -D. Lee ( Yonsei Univ. (South Korea) )
- B. -M. Kim ( Yonsei Univ. (South Korea) )
- 掲載資料名:
- Optical tomography and spectroscopy of tissue VII : 21-24 January 2007, San Jose, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6434
- 発行年:
- 2007
- ペーパー番号:
- 643428
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 16057422
- ISBN:
- 9780819465474 [081946547X]
- 言語:
- 英語
- 請求記号:
- P63600/6434
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
New image segmentation method using mode finding, multi-link clustering, and region graph analysis
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
Electrochemical Society |
SPIE - The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
4
国際会議録
Patterning with spacer for expanding the resolution limit of current lithography tool [6156-27]
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
Electrochemical Society |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |