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The consistency assessment of topological relations in cartographic generalization

著者名:
  • C. Zheng ( Wuhan Univ. (China) and Jiaying Univ. (China) )
  • Q. Guo ( Wuhan Univ. (China) )
  • X. Du ( Hubel Univ. (China) )
掲載資料名:
Geoinformatics 2006 : Geospatial information science : 28-29 October 2006, Wuhan, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6420
発行年:
2006
ペーパー番号:
64200T
開始ページ:
64200T-1
終了ページ:
64200T-12
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819465290 [0819465291]
言語:
英語
請求記号:
P63600/6420
資料種別:
国際会議録

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