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A new real-time surface profile measurement using a sinusoidal phase modulating interferometry

著者名:
  • G. He ( Shanghai Institute of Optics and Fine Mechanics (China) )
  • X. Wang ( Shanghai Institute of Optics and Fine Mechanics (China) )
  • D. Li ( Shanghai Institute of Optics and Fine Mechanics (China) )
  • J. Hu ( Shanghai Institute of Optics and Fine Mechanics (China) )
掲載資料名:
27th International Congress on High-Speed Photography and Photonics : 17-22 September 2006, Alexandria, Xian, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6279
発行年:
2007
パート:
2
ペーパー番号:
62794J
開始ページ:
62794J-1
終了ページ:
62794J-6
総ページ数:
6
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463494 [0819463493]
言語:
英語
請求記号:
P63600/6279
資料種別:
国際会議録

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