Structure and Process Parameter Optimization for Sub-10nm Gate Length Fully Depleted N-Type SOI MOSFETs by TCAD Modeling and Simulation
- 著者名:
- 掲載資料名:
- Transistor scaling--methods, materials and modeling : symposium held April 18-19, 2006, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 913
- 発行年:
- 2006
- 開始ページ:
- 39
- 終了ページ:
- 48
- 総ページ数:
- 10
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558998698 [1558998691]
- 言語:
- 英語
- 請求記号:
- M23500/913
- 資料種別:
- 国際会議録
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