Determination of optical constants and thickness of Nb20s optical films from normal incidence transmission spectra [6149-72]

Determination of optical constants and thickness of Nb20s optical films from normal incidence transmission spectra [6149-72]

著者名:

Lin, L. ( Fujian Normal Univ. (China) )
Lai,F. ( Fujian Normal Univ. (China) )
Huang. Z. ( Fujian Normal Univ. (China) )
Qu,Y. ( Fujian Normal Univ. (China) )
Gai,R. ( Fujian Normal Univ. (China) )

掲載資料名:

2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6149

発行年:

2006

開始ページ:

614920

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461889 [0819461881]

言語:

英語

請求記号:

P63600/6149

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016428
シリーズID:	PA00000029
会議名:	International Symposium on Advanced Optical Manufacturing and Testing Technologies
回次:	2005 : 2nd
会議開催地:	Xian, China
会議開催年:	2005.11.02-2005.11.05

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