Refractive index analysis of graded index coatings prepared by reactive magnetron sputtering [6149-52]
- 著者名:
Shen, Z. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Graduate School of the Chinese Academy of Sciences (China) ) Liu, S. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Graduate School of the Chinese Academy of Sciences (China) ) Kong, W. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Graduate School of the Chinese Academy of Sciences (China) ) Shen, J. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Graduate School of the Chinese Academy of Sciences (China) ) Shao, J. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) ) Fan, Z. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) ) - 掲載資料名:
- 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6149
- 発行年:
- 2006
- 開始ページ:
- 61491G
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461889 [0819461881]
- 言語:
- 英語
- 請求記号:
- P63600/6149
- 資料種別:
- 国際会議録
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5
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THE STRUCTURES OF TANTALUM PENTOXIDE FILM FORMED BY REACTIVE DC MAGNETRON SPUTTER-DEPOSITION OF Ta
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