Nonlinear multiphoton processes with soft x-ray photons and its application to autocorrelation measurement (Invited Paper) [5920-05]
- 著者名:
- Midorikawa, K.
- Hasegawa, H.
- Nabekawa, Y. ( RIKEN (Japan) )
- 掲載資料名:
- Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5920
- 発行年:
- 2005
- ペーパー番号:
- 591904
- 開始ページ:
- 592005
- 終了ページ:
- 592005
- 総ページ数:
- 1
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819459251 [0819459259]
- 言語:
- 英語
- 請求記号:
- P63600/5920
- 資料種別:
- 国際会議録
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