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Nonlinear multiphoton processes with soft x-ray photons and its application to autocorrelation measurement (Invited Paper) [5920-05]

著者名:
掲載資料名:
Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5920
発行年:
2005
ペーパー番号:
591904
開始ページ:
592005
終了ページ:
592005
総ページ数:
1
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819459251 [0819459259]
言語:
英語
請求記号:
P63600/5920
資料種別:
国際会議録

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