Blank Cover Image

Application of the adaptive subspace detector to Raman spectra for biological threat detection [6378-07]

著者名:
掲載資料名:
Chemical and biological sensors for industrial and environmental monitoring II : 3-4 October, 2006, Boston, Massachusetts, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6378
発行年:
2006
開始ページ:
637807
終了ページ:
637807
総ページ数:
1
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819464767 [0819464767]
言語:
英語
請求記号:
P63600/6378
資料種別:
国際会議録

類似資料:

R. E. Jabbour, A. Tripathi, P. J. Treado, J. H. Neiss, M. P. Nelson, J. L. Jensen, A. P. Snyder

SPIE - The International Society of Optical Engineering

Samuels, A. C., Santarpia, J. L., Bottiger, J. R., Hunter, S., Stuebing, E. W.

SPIE - The International Society of Optical Engineering

Wang, X., Voigt, T. C., Bos, P. J., Nelson, M. P., Treado, P. J.

SPIE - The International Society of Optical Engineering

Torrione, P. A., Throckmorton, C. S., Collins, L., Clodfelter, F., Frasier, S., Starnes, I., Bishop, S., Gugino, P., …

SPIE - The International Society of Optical Engineering

Sedlacek, A.J., III, Christesen, S.D., Chyba, T., Ponsardin, P.

SPIE - The International Society of Optical Engineering

R. C. Runkle, M. J. Myjak, M. T. Batdorf, R. S. Bowler, S. D. Kiff

Society of Photo-optical Instrumentation Engineers

C. W. Gardner, R. Wentworth, P. J. Treado, P. Batavia, G. Gilbert

Society of Photo-optical Instrumentation Engineers

Smith,R.D., Nelson,M.P., Treado,P.J.

SPIE - The International Society for Optical Engineering

A. Tripathi, R. E. Jabbour, P. J. Treado, J. H. Neiss, M. P. Nelson, J. L. Jensen, A. P. Snyder

SPIE - The International Society of Optical Engineering

Doyle, R. S., Lyons, B. N., Lettington, A. H., McEnroe, T., Walshe, J., McNaboe, J., Curtin, P., Bleszynski, S.

SPIE - The International Society of Optical Engineering

Maier, J. S., Treado, P. J.

SPIE - The International Society of Optical Engineering

Shimazu, R. N., Berglund, V. P., Falkofske, D. M., Krantz, B. S.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12