The effect of processes on the reliability of GaN-based light emitting diodes [6355-21]
- 著者名:
Xiao, Z. ( Dalian Luming Science and Technology Group Co., Ltd. (China) ) He, X. Ma, K. Chen, X. Wu, S. Ke, Z. ( Dalian Lumei Optoelectronics Corp. (China) ) - 掲載資料名:
- Advanced LEDs for solid state lighting : 5-7 September 2006, Gwangju, South Korea
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6355
- 発行年:
- 2006
- 開始ページ:
- 63550K
- 出版情報:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819464507 [0819464503]
- 言語:
- 英語
- 請求記号:
- P63600/6355
- 資料種別:
- 国際会議録
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