Application of least-squares support vector machine (LS-SVM) to determination of deep level defect centers parameters in semi-insulating GaAs [6347-109]

Application of least-squares support vector machine (LS-SVM) to determination of deep level defect centers parameters in semi-insulating GaAs [6347-109]

著者名:

Jankowski, S.
Kniota, M. ( Warsaw Univ. of Technology (Poland) )
Koztowski, R. ( Institute of Electronic Materials Technology (Poland) )

掲載資料名:

Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6347

発行年:

2006

パート:

2

開始ページ:

634731

終了ページ:

634731

総ページ数:

1

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819464316 [0819464317]

言語:

英語

請求記号:

P63600/6347

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016351
シリーズID:	PA00000029
会議名:	IEEE-SPIE Symposium on Photonics and Web Engineering Photonics & Electronics for Accelerators and HEP
回次:	2006 : 18th
会議開催地:	Wilga, Poland
会議開催年:	2006.05.29-2006.06.04

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