Simultaneous measurement of the refractive index, thickness, and position of suspended thin film [6343-71]

Simultaneous measurement of the refractive index, thickness, and position of suspended thin film [6343-71]

著者名:

Lai, C.-C.
Cheng, C.-H.
Chiu, W.-C.
Hsu, I-J. ( Chung Yuan Christian Univ. (Taiwan) )

掲載資料名:

Photonics North 2006

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6343

発行年:

2006

パート:

1

開始ページ:

634320

終了ページ:

634320

総ページ数:

1

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819464286 [0819464287]

言語:

英語

請求記号:

P63600/6343

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016348
シリーズID:	PA00000029
会議名:	Photonics North
回次:	2006
会議開催地:	Quebec City, QC, Canada
会議開催年:	2006.06.05-2006.06.08

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