The past, present, and future of optical design [6342-111]
- 著者名:
- Smith, W. J. ( Rockwell Collins Optronics (USA) )
- Betensky, E. ( Light Capture, Inc. (Canada) )
- Williamson, D. ( Nikon Research Corp. of America (USA) )
- Minano, J. C. ( Univ. Politecnica de Madrid (Spain) )
- Koshel, R. J. ( Lambda Research Corp. (USA) and College of Optical Sciences, Univ. of Arizona (USA) )
- 掲載資料名:
- International Optical Design Conference 2006
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6342
- 発行年:
- 2006
- パート:
- 2
- 開始ページ:
- 63422Y
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819464279 [0819464279]
- 言語:
- 英語
- 請求記号:
- P63600/6342
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
9
国際会議録
Past, Present and Future Cosmic Ray Identification Applications for Large Area Silicon Detectors
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