Plasmonic nearfield scanning optical microscopy [6324-07]

Plasmonic nearfield scanning optical microscopy [6324-07]

著者名:

Wang, Y.
Srituravanich, W.
Sun, C.
Zjhang, X. ( Univ. of California, Berkeley (USA) )

掲載資料名:

Plasmonics: Nanoimaging, Nanofabrication, and their Applications II

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6324

発行年:

2006

開始ページ:

632407

終了ページ:

632408

総ページ数:

2

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819464033 [0819464031]

言語:

英語

請求記号:

P63600/6324

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016330
シリーズID:	PA00000029
会議名:	Optics & Photonics : Plasmonics
回次:	2006 : 2nd
会議開催地:	San Diego, CA, USA
会議開催年:	2006.08.16-2006.08.17

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