Cd0.55Mn0.45Te crystal growth, microstructure, and electrical resistivity [6319A-34]

Cd0.55Mn0.45Te crystal growth, microstructure, and electrical resistivity [6319A-34]

著者名:

Black, M. A.
Orlova, T.
Lu, F. Y.
Li, L. ( Yinnel Tech, Inc. (USA) )

掲載資料名:

Hard X-ray and gamma-ray detector physics and Penetrating radiation systems VIII : 14-17 August 2006, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6319

発行年:

2006

開始ページ:

631913

終了ページ:

631913

総ページ数:

1

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819463982 [0819463981]

言語:

英語

請求記号:

P63600/6319

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016325
シリーズID:	PA00000029
会議名:	Optics & Photonics : Hard X-ray and gamma-ray detector physics and Penetrating radiation systems
回次:	2006 : 8th
会議開催地:	San Diego, CA, USA
会議開催年:	2006.08.14-2006.08.17

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