CdTe and Cd0.9Zn0.1Te crystal growth and characterization for nuclear spectrometers [6319A-29]
- 著者名:
- Mandal, K. C.
- Kang, S. H.
- Choi, M. ( EIC Labs., Inc. (USA) )
- Wright, G.
- Jellison, G. E. ( Oak Ridge National Lab. (USA) )
- 掲載資料名:
- Hard X-ray and gamma-ray detector physics and Penetrating radiation systems VIII : 14-17 August 2006, San Diego, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6319
- 発行年:
- 2006
- 開始ページ:
- 63190X
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819463982 [0819463981]
- 言語:
- 英語
- 請求記号:
- P63600/6319
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Crystal Growth and Characterization of CdTe and Cd₀.₉Zn₀.₁Te for Nuclear Radiation Detectors
Materials Research Society |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
MRS - Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
SPIE - The International Society of Optical Engineering |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
Electrochemical Society |