Blank Cover Image

General formulation for x-ray computed tomography [6318-65]

著者名:
掲載資料名:
Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6318
発行年:
2006
開始ページ:
63181N
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819463975 [0819463973]
言語:
英語
請求記号:
P63600/6318
資料種別:
国際会議録

類似資料:

Yu, H., Ye, Y., Wang, G.

SPIE - The International Society of Optical Engineering

Thran, A., Barschdorf, H., Martens, G., van Stevendaal, U., Schlomka, J.-P.

SPIE - The International Society of Optical Engineering

Li, T., Wang, J., Wen, J., Li, X., Lu, H., Hsieh, J., Liang, Z.

SPIE - The International Society of Optical Engineering

Wei, Y., Yu, H.B., Wang, S.

SPIE-The International Society for Optical Engineering

Ye, Y., Yu, H., Wang, G.

SPIE - The International Society of Optical Engineering

Deng, J., Yu, H., Ni, J., Wang, L., Wang, G.

SPIE - The International Society of Optical Engineering

Yu, H., Ye, Y., Wang, G.

SPIE - The International Society of Optical Engineering

Rau, C., Crecea, V., Richter, C.-P., Peterson, K. M., Jemian, P. R., Neuhausler, U., Schneider, G., Yu, X., Braun, P. …

SPIE - The International Society of Optical Engineering

Zhu, J., Li, X., Ye, Y., Wang, G.

SPIE - The International Society of Optical Engineering

Jiang, M., Zhou, T., Cheng, J., Cong, W., Wang, G.

SPIE - The International Society of Optical Engineering

Fan, D., Wu, M., Wang, J., Wei, H.

SPIE-The International Society for Optical Engineering

Lu, H., Li, X., Li, L., Chen, D., Xing, Y., Hsieh, J., Liang, Z.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12