Dark-field image of full-field transmission hard x-ray microscope in 8-11 keV [6317-03]
- 著者名:
Yin, -C. G. ( National Synchrotron Radiation Research Ctr. (Taiwan) and National Chiao Tung Univ. (Taiwan) ) Duewer, F. Zeng, X. Lyon, A. Yun, W. ( Xradia Inc. (USA) ) Chen, -R. F. ( National Synchrotron Radiation Research Ctr. (Taiwan) and National Chiao Tung Univ. (Taiwan) ) Liang, S. K. ( National Synchrotron Radiation Research Ctr. (Taiwan) ) - 掲載資料名:
- Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6317
- 発行年:
- 2006
- 開始ページ:
- 631703
- 終了ページ:
- 631703
- 総ページ数:
- 1
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819463968 [0819463965]
- 言語:
- 英語
- 請求記号:
- P63600/6317
- 資料種別:
- 国際会議録
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