Blank Cover Image

Real-time measurement of micrometer-order amplitude transverse vibrations using the photo- EMF effect in photoconductive materials [6292-38]

著者名:
掲載資料名:
Interferometry XIII: Techniques and Analysis
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6292
発行年:
2006
開始ページ:
629210
終了ページ:
629210
総ページ数:
1
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463715 [081946371X]
言語:
英語
請求記号:
P63600/6292
資料種別:
国際会議録

類似資料:

1 国際会議録 Speckle photo-electromotive force for large transverse vibration amplitude measurement

Mosquera, L., Frejlich, J.

SPIE - The International Society of Optical Engineering
7 国際会議録 Non-steady-state photo-EMF effect in photorefractive polymers

Bittner,R., Stepanov,S.I., Meerholz,K.

SPIE - The International Society for Optical Engineering
2 国際会議録 Large-amplitude photocurrent in photo-emf experiments in pure and doped absorbing photorefractive crystals

Mosquera, L., Frejlich, J.

SPIE - The International Society of Optical Engineering
8 国際会議録 Diffusion-cooled transversally microwave-pumped CO2 laser

Mosquera, C. F., Rios, I. J., Santiago, G. D.

SPIE - The International Society of Optical Engineering
3 国際会議録 Photo-EMF effect polydiacetylene PTS

Ramos-Garcia, R, Camacho-Pernas, V., Trevino-Palacios, C.G., Stegeman, G.I.

SPIE-The International Society for Optical Engineering
9 国際会議録 Real-time measurement of laser beam quality factor (M2) by imaging transverse scattered light

K. C. Jorge, R. Riva, N. A. S. Rodrigues, M. G. Destro

SPIE - The International Society of Optical Engineering
4 国際会議録 Optical measurement of oscillation freaquencies of vibrating objects by means of the photo-EMF effect [6046-40]

Castillo M., J., Tabon G., S., Beltran P., G., Munoz A., S.

SPIE - The International Society of Optical Engineering
10 国際会議録 Heterodyne interferometry for real-time displacement measurement by phase-to-amplitude conversion technique

H.-K. Teng, K.-C. Lang

Society of Photo-optical Instrumentation Engineers
5 国際会議録 Vibration measurement using laser interferometry

Silva Pineda, G., Argote, L. F.

SPIE - The International Society of Optical Engineering
11 国際会議録 Real-time two-color laser speckle-shift strain measurement system

Tuma,M.L., Greer III,L.C., Krasowski,M.J., Obefle,L.G., Elam,K.A., Spina,D.C.

SPIE-The International Society for Optical Engineering
6 国際会議録 Energy structure and micromechanism of photo-EMF effect in adaptive IR-detectors based on CdTe:V crystals [6294-38]

Gnatenko Yu. P., Brodyn M. S., Faryna I. O., Bukivskij P. M., Shigiltchoff O. A., Furyer M. S., Gamernyk R. V., …

SPIE - The International Society of Optical Engineering
12 国際会議録 Sub-quarter-micrometer contact hole fabrication using annular illumination

Erdelyi,M., Bor,Z., Szabo,G., Cavallaro,J.R., Smayling,M.C., Tittel,F.K., Wilson,W.L.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12