Error rate improvement of super-RENS random signal with the minimum mark length of 75 nm in 405 nm 0.85 NA system [6282-66]
- 著者名:
Bae, J. Kim, J. Hwang, I Kim, H. Lee, J. Park, H. ( Samsung Electronics Co., Ltd. (South Korea) ) Tominaga, J. ( National Institute of Advanced Industrial Science and Technology (Japan) ) - 掲載資料名:
- Optical Data Storage 2006 : 23-26 April 2006, Montreal, Canada
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6282
- 発行年:
- 2006
- 開始ページ:
- 628217
- 終了ページ:
- 628218
- 総ページ数:
- 2
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819463579 [0819463574]
- 言語:
- 英語
- 請求記号:
- P63600/6282
- 資料種別:
- 国際会議録
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